Giovanni D’Amore discusses approaches to characterising both dielectric and magnetic materials using impedance analysers and specialist fixtures. We are used to thinking about technological progress in terms of mobile phone model generations, or semiconductor manufacturing process nodes. These provide a useful shorthand, but overshadow progress in enabling technologies, such as those in materials science. Anyone ...
Read full article: Measuring critical material properties of capacitors and inductors
from Electronics Weekly http://www.electronicsweekly.com/news/measuring-critical-material-properties-capacitors-inductors-2017-03/
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