Only one month to go until the first Electronics Weekly webinar – Combining the Power of Functional Test and Embedded System Access Electronics Weekly has joined forces with Goepel Electronics to discuss one of the most serious problems in the area of test, the continuous decline in physical access to the I/O pins of ICs. Across a ...
Webinar: Combining the Power of Functional Test and Embedded System Access
from ElectronicsWeekly http://www.electronicsweekly.com/blogs/electro-ramblings/site-update/webinar-combining-the-power-of-functional-test-and-embedded-system-access-2016-05/
No comments:
Post a Comment