Check out a new whitepaper on the site relating to surface metrology. It’s from Olympus and it covers 4K scanning using the Olympus’ LEXT imaging platform. Particularly, how to capture the shape of any surface and measure challenging samples. Read the whitepaper » It is written by Dr. Megan Cordill who researches thin films on ...
This story continues at Olympus Whitepaper: Reaching the next level of surface metrology
Or just read more coverage at Electronics Weekly
from Electronics Weekly https://www.electronicsweekly.com/blogs/electro-ramblings/general-electronics/olympus-whitepaper-reaching-next-level-surface-metrology-2017-11/
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