Hprobe, the two year-old Grenoble provider of wafer test equipment for magnetic devices, has joined with Imec to develop advanced magnetic tester equipment for the next generation of MRAM devices based on the Spin Orbit Torque (SOT) effect. Hprobe has begun to optimize the test flow for SOT-MRAM devices in order to bring the characterization and testing to ...
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from Electronics Weekly https://www.electronicsweekly.com/news/business/hprobe-joins-imec-sot-mram-tester-development-2019-03/
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